SEM finder grids
These new SEM grids are designed to aid in the identification and localisation of SEM specimen...
SEM E-Beam lithography specimen mount, M4 cylinder (EMS)
The SEM E-Beam lithography specimen mount, with M4 threaded base comes complete with a Faraday...
Ultra high resolution Au-C on stub
With gold particles ranging from <1nm to 20nm, this test is suitable for ultra high resolut...
Very high resolution Au-C on stub
For very high resolution performance testing this specimen has a smaller gold particle size ra...
High resolution Au-C on stub
For resolution test of SE and BSE imaging and also for chemical mapping in high-resolution sys...
Tin-C test specimen on stub
Tin on Carbon is an alternate test specimen for medium resolution, and for the daily basic che...
MAC backscattered electron detector calibration standards
An electron microscope has the capacity to produce images in which contrast is controlled by t...
Standard test specimen set
The Standard Test Specimen keeps the Scanning Electron Microscope up to peak operating conditi...
Chessy test specimen
A precise SEM test specimen for most all calibration applications.Structure:
Magnification calibration diffraction grating replica, latex spheres (EMS)
The latex sphere is 0.261um and the grating replica is 2160 lines/mm. Calibration aid allows t...
X-Checker SEM calibration discs
The X-Checker was the first and remains the only complete calibration aid for SEM/EDS Systems....
Carbon grating replicas
Cross line pitch spacing of 463nm with 2160 lines/mm in both directions, cross at 90° for addi...
Calibration standards, 70-1D
This Calibration Reference specimen comes with a non-traceable, manufacturer's certificate. Th...
