TIPCHECK for AFM

TIPCHECKThe Tipcheck device is used for examining the shaft of the tip probe or for d...

Phase Imaging Test Specimen

Phase Imaging is a sharp probe, which is brought into proximity with the specimen surface. The...

SPM calibration specimens - 2DUTC

This traceable, Certified Standard is a select grade. Each standard is individually measured i...

SPM calibration specimens -150-2D

This calibration comes with a non-traceable, manufactures certificate. These states the averag...

SPM calibration specimens -150-1D

Accurate measurements of sub 0.5 micron features are increasingly important as nanotechnology ...

Calibration reference - AFM SEM 750-HD -Ni, unmounted

High Durability Calibration Reference Specimen for AFM and STMEach specimen is supplied wi...