TIPCHECK for AFM
TIPCHECKThe Tipcheck device is used for examining the shaft of the tip probe or for d...
Phase Imaging Test Specimen
Phase Imaging is a sharp probe, which is brought into proximity with the specimen surface. The...
SPM calibration specimens - 2DUTC
This traceable, Certified Standard is a select grade. Each standard is individually measured i...
SPM calibration specimens -150-2D
This calibration comes with a non-traceable, manufactures certificate. These states the averag...
SPM calibration specimens -150-1D
Accurate measurements of sub 0.5 micron features are increasingly important as nanotechnology ...
Calibration reference - AFM SEM 750-HD -Ni, unmounted
High Durability Calibration Reference Specimen for AFM and STMEach specimen is supplied wi...
SPM calibration specimens -300-2D
Array of PostsPitch ...
SPM calibration specimens -300-1D
 300-1D...