SPM calibration specimens - 700-1D, unmounted
Overall Benefits: Easier testing of your SPM. Improved accuracy of crit...
TIPCHECK for AFM
The Tipcheck device is used for examining the shaft of the tip probe or for determining the ti...
Phase imaging test specimen
Phase Imaging is a sharp probe, which is brought into proximity with the specimen surface. The...
SPM calibration specimens - 2DUTC
AFM Tapping Mode ScanThe bump height is about 90nm. This specimen is n...
SPM calibration specimens -150-2D
This calibration comes with a non-traceable, manufactures certificate. These states the averag...
SPM calibration specimens -150-1D
Accurate measurements of sub 0.5 micron features are increasingly important as nanotechnology ...
Calibration reference - AFM SEM 750-HD -Ni, unmounted
High Durability Calibration Reference Specimen for AFM and STMEach specimen is supplied wi...
SPM calibration specimens -300-2D
Array of PostsPitch ...
SPM calibration specimens -300-1D
300-1D...
SPM calibration specimens - 700-2D
Overall Benefits: Easier testing of your SPM. Improved accuracy of crit...