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Ultra high resolution Au-C on stub
With gold particles ranging from <1nm to 20nm, this test is suitable for ultra high resolution SEM tests such as field emission electron source. A magnification of at least 80,000x is required for this test.
Please choose carefully. Returns of this item are subject to approval.
Updated: 13-03-2025
| Code | Type | Pack Size | Availability | Price | Updated: 13-03-2025 |
|---|---|---|---|---|---|
| EMS79512-01 | 12.5mm pin | Each | 0 in stock (?) | $819.00 AUD | |
| EMS79512-02 | Joel | Each | 0 in stock (?) | $819.00 AUD | |
| EMS79512-03 | ISI | Each | 0 in stock (?) | $819.00 AUD | |
| EMS79512-04 | Hitachi | Each | 0 in stock (?) | $819.00 AUD | |
| EMS79512-05 | Carbon Planchet | Each | 0 in stock (?) | $819.00 AUD |
* Ordering Schedule
This item is available for back-order where 0 stock is listed.
We order from this manufacturer weekly, with an estimated lead time of 4 weeks.
This is the estimated lead time, based on the average time taken previously to fill orders from this particular supplier.
Lead times are from when we receive your order until when we fill your order. For delivery times, please see shipping information below.
