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High resolution Au-C on stub
For resolution test of SE and BSE imaging and also for chemical mapping in high-resolution systems such as an Auger scanning instrument. Each test specimen has a square grid pattern with large crystals in the centre of each square, and very fine crystals at the edges of each grid. Thus medium and high resolution gap tests are performed on the same specimen. Meantime, the larger crystals show facets which allow an assessment of the grey level reproduction available at high resolution. Gold particle range from 5nm to 150nm approximately.
| Code | Title | Type | Pack Size | Availability | Price | Updated: 18-01-2025 |
|---|---|---|---|---|---|---|
| EMS79510-01 | High resolution Au-C on stub | 12.5mm pin | Each | 0 in stock (?) | $359.00 AUD | |
| EMS79510-02 | High resolution Au-C on stub | Joel | Each | 0 in stock (?) | $359.00 AUD | |
| EMS79510-03 | High resolution Au-C on stub | ISI | Each | 0 in stock (?) | $359.00 AUD | |
| EMS79510-04 | High resolution Au-C on stub | Hitachi | Each | 0 in stock (?) | $359.00 AUD | |
| EMS79510-05 | High resolution Au-C on stub | Carbon Planchet | Each | 0 in stock (?) | $359.00 AUD |
* Ordering Schedule
This item is available for back-order where 0 stock is listed.
We order from this manufacturer weekly, with an estimated lead time of 4 weeks.
This is the estimated lead time, based on the average time taken previously to fill orders from this particular supplier.
Lead times are from when we receive your order until when we fill your order. For delivery times, please see shipping information below.
