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High resolution Au-C on stub
For resolution test of SE and BSE imaging and also for chemical mapping in high-resolution systems such as an Auger scanning instrument. Each test specimen has a square grid pattern with large crystals in the centre of each square, and very fine crystals at the edges of each grid. Thus medium and high resolution gap tests are performed on the same specimen. Meantime, the larger crystals show facets which allow an assessment of the grey level reproduction available at high resolution. Gold particle range from 5nm to 150nm approximately.
| Code | Type | Pack Size | Availability | Price | Updated: 04-06-2026 |
|---|---|---|---|---|---|
| EMS79510-01 | 12.5mm pin | Each | No ETA | $400.00 AUD | |
| EMS79510-02 | Joel | Each | No ETA | $400.00 AUD | |
| EMS79510-03 | ISI | Each | No ETA | $400.00 AUD | |
| EMS79510-04 | Hitachi | Each | No ETA | $400.00 AUD | |
| EMS79510-05 | Carbon Planchet | Each | No ETA | $400.00 AUD |
* Availability Explanation
X weeks – the estimated lead time, based on the average time taken previously to fill orders from this particular supplier. Lead times are from when we receive your order until when we fill your order. For delivery times, please see shipping information below.
In Stock – Plenty of stock on the shelf, ready to ship.
No ETA – our supplier has advised they cannot provide an accurate ETA. Generally there is some issue with supply, and it may be more than 6 months.
