Backscattered electron detector calibration standards

An electron microscope has the capacity to produce images in which contrast is controlled by the differences in atomic numbers (Z) across the specimen when equipped with a Backscattered Electron Detector (BSD).

Each of the standard specimens consists of two high purity elements that have an atomic number difference of 1. They are embedded side by side in a contrasting matrix and are available as a single mount or can be incorporated into a block of standards.

BSD Calibration Standard

The test sample enables the performance of Backscattered Detectors to be verified. The test sample consists of Carbon, Duplex Brass, Faraday Cup and the 4 atomic number reference standards which can be used to verify the performance or act as a quantitative reference. Checks detector and SEM performance. 30mm x 5mm carbon block with certified standards for system calibration.

Contains:

• Standards to check 1 atomic number resolution.
• Faraday cup to set probe current.
• Duplex brass to check 0.1 atomic number resolution

BSD Particle Analysis Standard

This standard allows you to set the grey levels for Backscatters as it goes across all grey areas. 13mm aluminium pin stub certified standards for system calibration. Diamond polished to 0.25um surface finish. Carbon coated.

Compounds, pure metal, NBS, or BAS Standards: Technical Data

MAC Materials List