- Collections
Silicon test specimens
This test specimen is made of a 5mm x 5mm square of single crystal silicon. It is photo-etched and the squares repeat every 10?m. The dividing lines are 1.9?m wide.
A broader etching line is written every 500?m, which is useful in light microscopy. This is an excellent test specimen for comparing magnification and assessing any distortion in the image field. It is ideally useful in the context of automated counting systems to check for unsuspected distortions. Where critical measurements must be made the sample can be mounted directly onto the calibration specimen so that an internal calibration is obtained on the micro-graph.
| Code | Title | Type | Pack Size | Availability | Price | Updated: 27-12-2024 |
|---|---|---|---|---|---|---|
| EMS79502-01 | Silicon test specimens | Test specimen, unmounted | Each | 0 in stock (?) | $202.00 AUD | |
| EMS79502-10 | Silicon test specimens | Test specimen, unmounted | Pack/10 | 0 in stock (?) | $1,504.00 AUD | |
| EMS79502-12 | Silicon test specimens | Test specimen, 12.5mm pin | Each | 0 in stock (?) | $223.00 AUD | |
| EMS79502-20 | Silicon test specimens | Test specimen, incident L.M | Each | 0 in stock (?) | $860.00 AUD | |
| EMS79502-30 | Silicon test specimens | Calibration certificate | Each | 0 in stock (?) | $616.00 AUD |
* Ordering Schedule
This item is available for back-order where 0 stock is listed.
We order from this manufacturer weekly, with an estimated lead time of 4 weeks.
This is the estimated lead time, based on the average time taken previously to fill orders from this particular supplier.
Lead times are from when we receive your order until when we fill your order. For delivery times, please see shipping information below.
