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SEM variable tilt specimen mount, pin mount
The SEM variable tilt specimen mount with 3.2mm diameter pin stub base is ideal for small working distances and is made from ultra-pure aluminium and is compatible with FEI, Phillips, LEO, Zeiss, Cambridge, Leica, and CamScan.
Specifications:
- Tilting of samples from 0-90°
- Mount is marked for 30, 45, 70 and 90°
- Size - 11mm x 11mm surface, overall 14mm x 14mm x 12.7mm
Store at room temperature
Please choose carefully. Returns of this item are subject to approval.
Updated: 27-12-2024
| Code | Title | Pack Size | Availability | Price | Updated: 27-12-2024 |
|---|---|---|---|---|---|
| EMS75952-05 | SEM variable tilt specimen mount, pin mount | Each | 0 in stock (?) | $167.00 AUD |
* Ordering Schedule
This item is available for back-order where 0 stock is listed.
We order from this manufacturer weekly, with an estimated lead time of 4 weeks.
This is the estimated lead time, based on the average time taken previously to fill orders from this particular supplier.
Lead times are from when we receive your order until when we fill your order. For delivery times, please see shipping information below.
