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Tin-C test specimen on stub

Tin on Carbon is an alternate test specimen for medium resolution, and for the daily basic checking of your instrument performance. This specimen consists of a dispersion of tin spheres, within the size range 10 - 40nm, on a carbon substrate. Ideal for astigmatism correction, it is also recommended for use in SEM employed in the semi-conductor industry where the usual gold on carbon specimen cannot be used because of the risk of gold poisoning.

Please choose carefully. Returns of this item are subject to approval.

Updated: 13-03-2025

Code	Type	Pack Size	Availability	Price
GSM79515-01	12.5mm pin	Each	1 in stock	$519.00 AUD
GSM79515-02	Joel	Each	0 in stock (?)	$519.00 AUD
GSM79515-03	ISI	Each	0 in stock (?)	$519.00 AUD
GSM79515-04	Hitachi	Each	0 in stock (?)	$519.00 AUD

* Ordering Schedule

This item is available for back-order where 0 stock is listed.
We order from this manufacturer weekly, with an estimated lead time of 4 weeks.

This is the estimated lead time, based on the average time taken previously to fill orders from this particular supplier.
Lead times are from when we receive your order until when we fill your order. For delivery times, please see shipping information below.