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Tin-C test specimen on stub
Tin on Carbon is an alternate test specimen for medium resolution, and for the daily basic checking of your instrument performance. This specimen consists of a dispersion of tin spheres, within the size range 10 - 40nm, on a carbon substrate. Ideal for astigmatism correction, it is also recommended for use in SEM employed in the semi-conductor industry where the usual gold on carbon specimen cannot be used because of the risk of gold poisoning.
Please choose carefully. Returns of this item are subject to approval.
| Code | Title | Type | Pack Size | Availability | Price | Updated: 13-10-2024 |
|---|---|---|---|---|---|---|
| GSM79515-01 | Tin-C test specimen on stub | 12.5mm pin | Each | 1 in stock | $519.00 AUD | |
| GSM79515-02 | Tin-C test specimen on stub | Joel | Each | See above | $519.00 AUD | |
| GSM79515-03 | Tin-C test specimen on stub | ISI | Each | See above | $519.00 AUD | |
| GSM79515-04 | Tin-C test specimen on stub | Hitachi | Each | See above | $519.00 AUD | |
