SPM calibration specimens -150-1D
Accurate measurements of sub 0.5 micron features are increasingly important as nanotechnology develops and as conventional microfabricated structures (semiconductors, magnetic data storage devices, optical data discs) shrinking. The model 150-1D with a nominal period (pitch) of 150nm, one dimensional, fabricated on a transparent substrate (Aluminum lines on glass) is the new tool to support this work.
|Code||Title||Surface||Pack Size||Availability||Price||Updated: 09-12-2021|
|EMS80125-1D||SPM calibration specimens -150-1D||unmounted||Each||2 weeks||$1,297.00 AUD|
|EMS80125-1D-AFM||SPM calibration specimens -150-1D||AFM||Each||2 weeks||$1,491.00 AUD|
|EMS80125-1D-PIN||SPM calibration specimens -150-1D||SEM Pin||Each||2 weeks||$1,491.00 AUD|
|EMS80125-1D-X||SPM calibration specimens -150-1D||Choose mount||Each||2 weeks||$1,514.00 AUD|