SPM calibration specimens -150-1D
Accurate measurements of sub 0.5 micron features are increasingly important as nanotechnology develops and as conventional microfabricated structures (semiconductors, magnetic data storage devices, optical data discs) shrinking. The model 150-1D with a nominal period (pitch) of 150nm, one dimensional, fabricated on a transparent substrate (Aluminum lines on glass) is the new tool to support this work.
Please choose carefully. Returns of this item are subject to approval.
Code | Title | Surface | Pack Size | Availability | Price | Updated: 23-04-2024 |
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EMS80125-1D | SPM calibration specimens -150-1D | unmounted | Each | See above | $1,512.00 AUD | |
EMS80125-1D-AFM | SPM calibration specimens -150-1D | AFM | Each | See above | $1,769.00 AUD | |
EMS80125-1D-PIN | SPM calibration specimens -150-1D | SEM Pin | Each | See above | Quote only | Quote |
Quote | ||||||
EMS80125-1D-X | SPM calibration specimens -150-1D | Choose mount | Each | See above | $1,769.00 AUD | |