Silicon test specimens

This test specimen is made of a 5mm x 5mm square of single crystal silicon. It is photo-etched and the squares repeat every 10µm. The dividing lines are 1.9µm wide.

A broader etching line is written every 500µm, which is useful in light microscopy. This is an excellent test specimen for comparing magnification and assessing any distortion in the image field. It is ideally useful in the context of automated counting systems to check for unsuspected distortions. Where critical measurements must be made the sample can be mounted directly onto the calibration specimen so that an internal calibration is obtained on the micro-graph.

Updated: 04-06-2026
Code Type Pack Size Availability Price Updated: 04-06-2026
EMS79502-01 Test specimen, unmounted Each No ETA $226.00 AUD
EMS79502-10 Test specimen, unmounted Pack/10 No ETA $1,720.00 AUD
EMS79502-12 Test specimen, 12.5mm pin Each No ETA $257.00 AUD
EMS79502-20 Test specimen, incident L.M Each No ETA $462.00 AUD
EMS79502-30 Calibration certificate Each No ETA $841.00 AUD

* Availability Explanation

X weeks – the estimated lead time, based on the average time taken previously to fill orders from this particular supplier. Lead times are from when we receive your order until when we fill your order. For delivery times, please see shipping information below.

In Stock – Plenty of stock on the shelf, ready to ship.

No ETA – our supplier has advised they cannot provide an accurate ETA. Generally there is some issue with supply, and it may be more than 6 months.