Critical dimension magnification standards, X-axis
Economical, yet full-featured calibration over a wide measurement range.
- Scale range on X-axis, unmounted
- 60nm chrome for larger features and 20nm chrome with 40nm gold for high-resolution features to give increased contrast
- Unique serial number for each die
- Manufactured using advanced MEMS technology
Traceable and Certified Options- Traceable CD standards use average data measured for each wafer. Each certified CD standard is individually calibrated against a NIST measured standard.
Specifications:
| Model |
EMS79505-02 |
EMS79505-03 |
EMS79505-04 |
| Die Size | 2.5mm x 2.5mm | ||
| Lines | Chrome and Gold | ||
| Silicon Thickness | 525 ± 20µm | ||
| Scale Range Features |
2.0mm to 100nm: 2mm, 1mm, 0.5m, 0.1mm, 50µm, 10µm, 5µm, 2µm, 1µm, 500nm, 250nm, and 100nm | 2.0mm to 1µm: 2mm, 1mm, 0.5mm, 0.1mm, 50µm, 10µm, 5µm, 2µm, and 1µm |
2.0mm to 1µm: 2mm, 1mm, 0.5mm, 0.1mm, 50µm, 10µm, 5µm, 2µm, and 1µm |
* Availability Explanation
X weeks – the estimated lead time, based on the average time taken previously to fill orders from this particular supplier. Lead times are from when we receive your order until when we fill your order. For delivery times, please see shipping information below.
In Stock – Plenty of stock on the shelf, ready to ship.
No ETA – our supplier has advised they cannot provide an accurate ETA. Generally there is some issue with supply, and it may be more than 6 months.
