
- Collections
BSE reference standards
When equipped with a back-scattered electron detector, an electron microscope has the capability to produce images in which the contrast is controlled by differences in atomic number across the specimen. Three reference samples are now available for testing the differences of atomic number. Each of the reference samples consists of two high purity elements that have an atomic number difference of 1. They are in form of a wire of the low Z element embedded in a matrix of the high Z element. The samples are mounted onto 5mm diameter blocks.
* Ordering Schedule
This item is available for back-order where 0 stock is listed.
We order from this manufacturer weekly, with an estimated lead time of 4 weeks.
This is the estimated lead time, based on the average time taken previously to fill orders from this particular supplier.
Lead times are from when we receive your order until when we fill your order. For delivery times, please see shipping information below.