- Collections
SEM FIB sample and grid holder, pin mount
The SEM FIB sample and grid holder with 3.2mm diameter pin stub base holds an FIB sample mounted on a standard 25mm pin stub for FIB milling and lift out procedures and can also be used to hold FIB grids of the same thickness to mount the prepared lamellae on an FIB grid for TEM imaging. Made from vacuum grade aluminium with convenient brass screws to make loading and unloading easy. Compatible with all FIB/SEM systems which accept pin mount holders, including the FEI, ZEISS and Tescan systems. For the JEOL and Hitachi systems, use a pin mount adapter.
Sizes:
- 50mm x 29mm x 13.5mm
| Code | Title | Style | Pack Size | Availability | Price | Updated: 27-12-2024 |
|---|---|---|---|---|---|---|
| EMS75950-06 | SEM FIB sample and grid holder, pin mount | Single 1" pin | Each | 0 in stock (?) | $588.00 AUD |
* Ordering Schedule
This item is available for back-order where 0 stock is listed.
We order from this manufacturer weekly, with an estimated lead time of 4 weeks.
This is the estimated lead time, based on the average time taken previously to fill orders from this particular supplier.
Lead times are from when we receive your order until when we fill your order. For delivery times, please see shipping information below.
