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SEM double FIB sample and grid holder, pin mount
The SEM double FIB sample and grid holder with 3.2mm diameter pin stub base holds FIB samples mounted on two standard 12.7mm pin mounts for FIB milling and lift-out procedures and conveniently holds two FIB grids close to the sample to mount prepared TEM lamellae on the FIB grid for TEM imaging. Made from vacuum grade aluminium with brass screws. Includes Philips screwdriver #0. Compatible with FIB/SEM systems which accept pin mount holders, including the FEI, ZEISS and Tescan systems. For the JEOL and Hitachi systems, use a pin mount adapter.
Sizes:
- Overall size 36.5mm x 12.7mm x 11.6mm
| Code | Title | Pack Size | Availability | Price | Updated: 27-12-2024 |
|---|---|---|---|---|---|
| EMS75950-04 | SEM double FIB sample and grid holder, pin mount | Each | 0 in stock (?) | $697.00 AUD |
* Ordering Schedule
This item is available for back-order where 0 stock is listed.
We order from this manufacturer weekly, with an estimated lead time of 4 weeks.
This is the estimated lead time, based on the average time taken previously to fill orders from this particular supplier.
Lead times are from when we receive your order until when we fill your order. For delivery times, please see shipping information below.
