SEM FIB sample and grid holder, pin mount

The SEM FIB sample and grid holder with 3.2mm diameter pin stub base holds an FIB sample mounted on a standard 25mm pin stub for FIB milling and lift out procedures and can also be used to hold FIB grids of the same thickness to mount the prepared lamellae on an FIB grid for TEM imaging. Made from vacuum grade aluminium with convenient brass screws to make loading and unloading easy. Compatible with all FIB/SEM systems which accept pin mount holders, including the FEI, ZEISS and Tescan systems. For the JEOL and Hitachi systems, use a pin mount adapter.

Sizes:

• 50mm x 29mm x 13.5mm