Silicon test specimen, unmounted

This test specimen is made of a 5 x 5mm square of single crystal silicon. It is photo-etched and the squares repeat every 10µm. The dividing lines are 1.9µm wide.

A broader etching line is written every 500µm, which is useful in light microscopy. This is an excellent test specimen for comparing magnification and assessing any distortion in the image field. It is ideally useful in the context of automated counting systems to check for unsuspected distortions. Where critical measurements must be made the sample can be mounted directly onto the calibration specimen so that an internal calibration is obtained on the micro-graph.

Technical data sheet

Code Title Pack Size Availability Price Updated: 22-01-2022
EMS79502-01 Silicon test specimen, unmounted Each 2 weeks Quote only Quote
EMS79502-10 Silicon test specimen, unmounted Pack/10 2 weeks Quote only Quote