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Ion Mill Stage for tripod polisher, Model 5901
The Ion Mill Stage is designed to accept the special SEM stub used with the Tripod Polisher. The SEM stub is mounted to the Ion Mill Stage and the samples are briefly ion milled in order to remove fine scratches, polishing debris and to give the surface topography prior to SEM analysis.
Store at room temperature
| Code | Pack Size | Availability | Price | Updated: 24-06-2025 |
|---|---|---|---|---|
| EMS50118-01 | Each | 0 in stock (?) | $447.00 AUD |
* Ordering Schedule
This item is available for back-order where 0 stock is listed.
We order from this manufacturer weekly, with an estimated lead time of 4 weeks.
This is the estimated lead time, based on the average time taken previously to fill orders from this particular supplier.
Lead times are from when we receive your order until when we fill your order. For delivery times, please see shipping information below.
